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Sawant, Ronit, Yang, Shize, Carpenter, R W (2023) High-Resolution Composition Wave Characterization in Cu-Ti Alloys using Aberration Corrected STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1781-1783 doi:10.1093/micmic/ozad067.922

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Reference TypeJournal (article/letter/editorial)
TitleHigh-Resolution Composition Wave Characterization in Cu-Ti Alloys using Aberration Corrected STEM
JournalMicroscopy and Microanalysis
AuthorsSawant, RonitAuthor
Yang, ShizeAuthor
Carpenter, R WAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.922Search in ResearchGate
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Mindat Ref. ID16637586Long-form Identifiermindat:1:5:16637586:2
GUID0
Full ReferenceSawant, Ronit, Yang, Shize, Carpenter, R W (2023) High-Resolution Composition Wave Characterization in Cu-Ti Alloys using Aberration Corrected STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1781-1783 doi:10.1093/micmic/ozad067.922
Plain TextSawant, Ronit, Yang, Shize, Carpenter, R W (2023) High-Resolution Composition Wave Characterization in Cu-Ti Alloys using Aberration Corrected STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1781-1783 doi:10.1093/micmic/ozad067.922
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Klie, Robert F (2023) Analytical Characterization of Functional Materials using Cryo-FIB/SEM and Aberration-corrected Cryo-STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1702-1703 doi:10.1093/micmic/ozad067.877
Hwang, Sooyeon (2023) Secondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 764-765 doi:10.1093/micmic/ozad067.377
Sawant, Ronit, Carpenter, R W (2022) Characterization of Modulated Nanostructure in Au-Pt Alloy using Aberration Corrected STEM. Microscopy and Microanalysis, 28. 2394-2396 doi:10.1017/s1431927622009187
Tan, Mai, Yang, Shize, Crozier, Peter A (2023) Seeing Cation Dopants in Gd-doped Ceria with STEM-EELS. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 413-415 doi:10.1093/micmic/ozad067.195
Pattison, Alexander J, Noack, Marcus, Ercius, Peter (2023) Automating STEM Aberration Correction via Bayesian Optimization. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1881-1882 doi:10.1093/micmic/ozad067.971
Reed, B W, Bloom, R S, Yagi, K, Masiel, D J (2023) High-Speed 4D-STEM using Electrostatic Subframing. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 298-299 doi:10.1093/micmic/ozad067.138
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Aoki, Toshihiro, Sawada, Hidetaka, Du, Chaojie, Pan, Xiaoqing (2023) Quickly Switchable Angular and Spatially Resolved Cs-corrected STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 348-349 doi:10.1093/micmic/ozad067.162
Wang, Yifan, Yang, Shize, Crozier, Peter A (2023) Spectroscopic Observation and Modeling of Photonic Modes in CeO2 Nanostructures. Microscopy and Microanalysis, 29 (4) Oxford University Press (OUP) 1307-1314 doi:10.1093/micmic/ozad059
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Oxley, Mark P, Lou, Wei, Yoon, M, Chi, M (2023) Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 743-744 doi:10.1093/micmic/ozad067.366
 
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