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Luo, Xinglan, Zheng, Yi, Sanche, Léon (2014) DNA strand breaks and crosslinks induced by transient anions in the range 2-20 eV. The Journal of Chemical Physics, 140 (15). 155101pp. doi:10.1063/1.4870519

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Reference TypeJournal (article/letter/editorial)
TitleDNA strand breaks and crosslinks induced by transient anions in the range 2-20 eV
JournalThe Journal of Chemical Physics
AuthorsLuo, XinglanAuthor
Zheng, YiAuthor
Sanche, LéonAuthor
Year2014 (April 21)Volume140
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.4870519Search in ResearchGate
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Mindat Ref. ID2367397Long-form Identifiermindat:1:5:2367397:9
GUID0
Full ReferenceLuo, Xinglan, Zheng, Yi, Sanche, Léon (2014) DNA strand breaks and crosslinks induced by transient anions in the range 2-20 eV. The Journal of Chemical Physics, 140 (15). 155101pp. doi:10.1063/1.4870519
Plain TextLuo, Xinglan, Zheng, Yi, Sanche, Léon (2014) DNA strand breaks and crosslinks induced by transient anions in the range 2-20 eV. The Journal of Chemical Physics, 140 (15). 155101pp. doi:10.1063/1.4870519
In(2014, April) The Journal of Chemical Physics Vol. 140 (15) AIP Publishing

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Dong, Yanfang; Huang, Xin; Zhang, Wenlu; Shao, Yu; Cloutier, Pierre; Zheng, Yi; Sanche, Léon (2025) Hyperthermal Reactions in DNA Triggered by 1–20 eV Electrons: Absolute Cross Sections for Crosslinks, Strand Breaks, Clustered Damages and Base Modifications. International Journal of Molecular Sciences, 26 (9). doi:10.3390/ijms26094057
Bao, Qianhong, Chen, Yunfeng, Zheng, Yi, Sanche, Léon (2014) Cisplatin Radiosensitization of DNA Irradiated with 2–20 eV Electrons: Role of Transient Anions. The Journal of Physical Chemistry C, 118 (28). 15516-15524 doi:10.1021/jp503706h
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Dong, Yanfang, Gao, Yingxia, Liu, Wenhui, Gao, Ting, Zheng, Yi, Sanche, Léon (2019) Clustered DNA Damage Induced by 2–20 eV Electrons and Transient Anions: General Mechanism and Correlation to Cell Death. The Journal of Physical Chemistry Letters, 10 (11). 2985-2990 doi:10.1021/acs.jpclett.9b01063
Zheng, Yi, Cloutier, Pierre, Hunting, Darel J., Wagner, J. Richard, Sanche, Léon (2006) Phosphodiester and N-glycosidic bond cleavage in DNA induced by 4–15 eV electrons. The Journal of Chemical Physics, 124 (6). 64710pp. doi:10.1063/1.2166364
Zheng, Yi, Sanche, Léon (2019) Clustered DNA Damages induced by 0.5 to 30 eV Electrons. International Journal of Molecular Sciences, 20. 3749pp. doi:10.3390/ijms20153749
Dong, Yanfang, Wang, Yaxiao, Zhuang, Puxiang, Fu, Xianzhi, Zheng, Yi, Sanche, Léon (2020) Role of Transient Anions in Chemoradiation Therapy: Base Modifications, Cross-Links, and Cluster Damages Induced to Cisplatin-DNA Complexes by 1–20 eV Electrons. The Journal of Physical Chemistry B, 124 (16) 3315-3325 doi:10.1021/acs.jpcb.0c00946
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