Zheng, Yi, Sanche, Léon (2019) Clustered DNA Damages induced by 0.5 to 30 eV Electrons. International Journal of Molecular Sciences, 20. 3749pp. doi:10.3390/ijms20153749
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Clustered DNA Damages induced by 0.5 to 30 eV Electrons | ||
| Journal | International Journal of Molecular Sciences | ||
| Authors | Zheng, Yi | Author | |
| Sanche, Léon | Author | ||
| Year | 2019 (July 31) | Volume | 20 |
| Publisher | MDPI AG | ||
| DOI | doi:10.3390/ijms20153749Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 10072541 | Long-form Identifier | mindat:1:5:10072541:8 |
| GUID | 0 | ||
| Full Reference | Zheng, Yi, Sanche, Léon (2019) Clustered DNA Damages induced by 0.5 to 30 eV Electrons. International Journal of Molecular Sciences, 20. 3749pp. doi:10.3390/ijms20153749 | ||
| Plain Text | Zheng, Yi, Sanche, Léon (2019) Clustered DNA Damages induced by 0.5 to 30 eV Electrons. International Journal of Molecular Sciences, 20. 3749pp. doi:10.3390/ijms20153749 | ||
| In | (n.d.) International Journal of Molecular Sciences Vol. 20. MDPI AG | ||
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