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Shao, Yu, Dong, Yanfang, Hunting, Darel, Zheng, Yi, Sanche, Léon (2017) Unified Mechanism for the Generation of Isolated and Clustered DNA Damages by a Single Low Energy (5–10 eV) Electron. The Journal of Physical Chemistry C, 121 (4). 2466-2472 doi:10.1021/acs.jpcc.6b12110

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Reference TypeJournal (article/letter/editorial)
TitleUnified Mechanism for the Generation of Isolated and Clustered DNA Damages by a Single Low Energy (5–10 eV) Electron
JournalThe Journal of Physical Chemistry C
AuthorsShao, YuAuthor
Dong, YanfangAuthor
Hunting, DarelAuthor
Zheng, YiAuthor
Sanche, LéonAuthor
Year2017 (February 2)Volume121
Issue4
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/acs.jpcc.6b12110Search in ResearchGate
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Mindat Ref. ID3926331Long-form Identifiermindat:1:5:3926331:1
GUID0
Full ReferenceShao, Yu, Dong, Yanfang, Hunting, Darel, Zheng, Yi, Sanche, Léon (2017) Unified Mechanism for the Generation of Isolated and Clustered DNA Damages by a Single Low Energy (5–10 eV) Electron. The Journal of Physical Chemistry C, 121 (4). 2466-2472 doi:10.1021/acs.jpcc.6b12110
Plain TextShao, Yu, Dong, Yanfang, Hunting, Darel, Zheng, Yi, Sanche, Léon (2017) Unified Mechanism for the Generation of Isolated and Clustered DNA Damages by a Single Low Energy (5–10 eV) Electron. The Journal of Physical Chemistry C, 121 (4). 2466-2472 doi:10.1021/acs.jpcc.6b12110
In(2017, February) The Journal of Physical Chemistry C Vol. 121 (4) American Chemical Society (ACS)


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