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Kloess, G., Cröll, A., Benz, K.W. (1996) Contactless measurement of dopant distribution using etch roughnesses. Journal of Crystal Growth, 166 (1). 319-324 doi:10.1016/0022-0248(96)00093-0

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Reference TypeJournal (article/letter/editorial)
TitleContactless measurement of dopant distribution using etch roughnesses
JournalJournal of Crystal Growth
AuthorsKloess, G.Author
Cröll, A.Author
Benz, K.W.Author
Year1996 (September)Volume166
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0022-0248(96)00093-0Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID2829398Long-form Identifiermindat:1:5:2829398:1
GUID0
Full ReferenceKloess, G., Cröll, A., Benz, K.W. (1996) Contactless measurement of dopant distribution using etch roughnesses. Journal of Crystal Growth, 166 (1). 319-324 doi:10.1016/0022-0248(96)00093-0
Plain TextKloess, G., Cröll, A., Benz, K.W. (1996) Contactless measurement of dopant distribution using etch roughnesses. Journal of Crystal Growth, 166 (1). 319-324 doi:10.1016/0022-0248(96)00093-0
In(1996, September) Journal of Crystal Growth Vol. 166 (1) Elsevier BV

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Cröll, A., Schweizer, M., Tegetmeier, A., Benz, K.W. (1996) Floating-zone growth of GaAs. Journal of Crystal Growth, 166 (1). 239-244 doi:10.1016/0022-0248(96)00059-0
Tegetmeier, A., Cröll, A., Danilewsky, A., Benz, K.W. (1996) GaSb: surface tension and floating-zone growth. Journal of Crystal Growth, 166 (1). 651-656 doi:10.1016/0022-0248(96)00134-0
Dold, P., Schweizer, M., Cröll, A., Benz, K.W. (2002) Measurement of microscopic growth rates in float zone silicon crystals. Journal of Crystal Growth, 237. 1671-1677 doi:10.1016/s0022-0248(01)02318-1
Kloess, G., Laasch, M., Schwarz, R., Benz, K.W. (1995) Stress birefringence and microinclusions in sublimation-grown bulk CdTe. Journal of Crystal Growth, 146 (1). 130-135 doi:10.1016/0022-0248(94)00524-9
Laasch, M., Kloess, G., Kunz, Th., Schwarz, R., Grasza, K., Eiche, C., Benz, K.W. (1996) Stress birefringence in vapour-grown CdTe and its correlation to the growth techniques. Journal of Crystal Growth, 161 (1). 34-39 doi:10.1016/0022-0248(95)00608-7
Cröll, A., Dold, P., Benz, K.W. (1994) Segregation in Si floating-zone crystals grown under microgravity and in a magnetic field. Journal of Crystal Growth, 137 (1). 95-101 doi:10.1016/0022-0248(94)91254-8
Tegetmeier, A., Cröll, A., Benz, K.W. (1994) A formula describing the temperature dependence of surface tension for some semiconductors melts. Journal of Crystal Growth, 141 (3). 451-454 doi:10.1016/0022-0248(94)90251-8
Dold, P., Cröll, A., Lichtensteiger, M., Kaiser, Th., Benz, K.W. (2001) Floating zone growth of silicon in magnetic fields:. Journal of Crystal Growth, 231 (1). 95-106 doi:10.1016/s0022-0248(01)01491-9
Benz, K.W., Mullin, J.B. (1995) Preface. Journal of Crystal Growth, 146 (1). doi:10.1016/0022-0248(95)80009-3
Eiche, C., Joerger, W., Fiederle, M., Ebling, D., Salk, M., Schwarz, R., Benz, K.W. (1996) Characterization of CdTe:Cl crystals grown under microgravity conditions by time dependent charge measurements (TDCM). Journal of Crystal Growth, 166 (1). 245-250 doi:10.1016/0022-0248(96)00071-1
Schweizer, M, Cröll, A, Dold, P, Kaiser, Th, Lichtensteiger, M, Benz, K.W (1999) Measurement of temperature fluctuations and microscopic growth rates in a silicon floating zone under microgravity. Journal of Crystal Growth, 203 (4). 500-510 doi:10.1016/s0022-0248(99)00155-4
 
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