Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryMineral Visual ExplorerAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral QuizTime Machine
Photo SearchPhoto GalleriesSearch by ColorPhoto Colour ExplorerNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

McGehee, R., Renault, J. (1972) The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method. Journal of Applied Crystallography, 5 (5) 365-370 doi:10.1107/s002188987200977x

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleThe use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method
JournalJournal of Applied Crystallography
AuthorsMcGehee, R.Author
Renault, J.Author
Year1972 (October 1)Volume5
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s002188987200977xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID463588Long-form Identifiermindat:1:5:463588:2
GUID0
Full ReferenceMcGehee, R., Renault, J. (1972) The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method. Journal of Applied Crystallography, 5 (5) 365-370 doi:10.1107/s002188987200977x
Plain TextMcGehee, R., Renault, J. (1972) The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method. Journal of Applied Crystallography, 5 (5) 365-370 doi:10.1107/s002188987200977x
In(1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr)

See Also

These are possibly similar items as determined by title/reference text matching only.

Barns, R. L. (1972) A method of preparation of powder samples for Debye–Scherrer–Hull X-ray diffraction. Journal of Applied Crystallography, 5 (5) 381-382 doi:10.1107/s0021889872009860
Balzar, D. (1992) Profile fitting of X-ray diffraction lines and Fourier analysis of broadening. Journal of Applied Crystallography, 25 (5). 559-570 doi:10.1107/s0021889892004084
Polizzi, S., Fagherazzi, G., Benedetti, A., Battagliarin, M., Asano, T. (1990) A fitting method for the determination of crystallinity by means of X-ray diffraction. Journal of Applied Crystallography, 23 (5). 359-365 doi:10.1107/s0021889890004939
Cheary, R. W., Grimes, N. W. (1972) The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography, 5 (2) 57-63 doi:10.1107/s0021889872008775
Xuong, Nguyen huu (1972) A double-scan method for powder X-ray diffraction film. Journal of Applied Crystallography, 5 (1) 54 doi:10.1107/s002188987200874x
Lundy, D. R., Eanes, E. D. (1972) A computer program for the separation of linearly sloping backgrounds in X-ray line broadening analysis. Journal of Applied Crystallography, 5 (5) 380-381 doi:10.1107/s0021889872009859
Hecq, M. (1981) A fitting method for X-ray diffraction profiles. Journal of Applied Crystallography, 14 (1) 60-61 doi:10.1107/s0021889881008686
de Keijser, Th. H., Langford, J. I., Mittemeijer, E. J., Vogels, A. B. P. (1982) Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening. Journal of Applied Crystallography, 15 (3) 308-314 doi:10.1107/s0021889882012035
Curzon, A. E., Luhman, T. S., Silcock, J. M. (1972) A comment on the use of symmetry arguments in the interpretation of X-ray diffraction patterns from two-phase systems. Journal of Applied Crystallography, 5 (6) 425-427 doi:10.1107/s0021889872010088
Sánchez-Bajo, F., Cumbrera, F. L. (1997) The use of the pseudo-Voigt function in the variance method of X-ray line-broadening analysis. Erratum. Journal of Applied Crystallography, 30 (5). 550 doi:10.1107/s0021889897098956
Ĺ oler, J., Baldrian, J. (1972) Effect of finite slit height on the tail of a small-angle X-ray scattering curve. Journal of Applied Crystallography, 5 (6) 428-429 doi:10.1107/s002188987201009x
 
and/or  
Mindat.org® is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization. Mindat® and mindat.org® are registered trademarks of the Hudson Institute of Mineralogy.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2026, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph and Ida Chau.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: June 8, 2026 12:39:43
Go to top of page