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(1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr)

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Reference TypeJournal (issue)
JournalJournal of Applied Crystallography
Year1972 (October)Volume5
Issue<   5   >
PublisherInternational Union of Crystallography (IUCr)
Mindat Ref. ID463562Long-form Identifiermindat:1:5:463562:2
GUID0
Full Reference(1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr)
Plain Text(1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr)
In(1972) Journal of Applied Crystallography Vol. 5. International Union of Crystallography (IUCr)

Contains

Deganello, S. (1972) A method for aligning crystals in precession photography using monochromated radiation. Journal of Applied Crystallography, 5 (5) 313-315 doi:10.1107/s0021889872009689
Hendricks, R. W. (1972) A unified theory of absolute intensity measurements in small-angle X-ray scattering. Journal of Applied Crystallography, 5 (5) 315-324 doi:10.1107/s0021889872009690
Suortti, P. (1972) Effects of porosity and surface roughness on the X-ray intensity reflected from a powder specimen. Journal of Applied Crystallography, 5 (5) 325-331 doi:10.1107/s0021889872009707
Millar, J. J. (1972) Precession photography: general transformation equations and a new alignment method. Journal of Applied Crystallography, 5 (5) 332-338 doi:10.1107/s0021889872009719
Dachs, H., Knorr, K. (1972) Guinier camera for single crystal investigation. Journal of Applied Crystallography, 5 (5) 338-342 doi:10.1107/s0021889872009720
Majumdar, A. J., Vallance, L. S., Born, C. G. G. (1972) Quantitative analysis of phase composition using X-ray diffraction methods. Journal of Applied Crystallography, 5 (5) 343-347 doi:10.1107/s0021889872009732
Tiwari, R. S., Srivastava, O. N. (1972) On the phase transformation in cadmium iodide polytypic crystals. Journal of Applied Crystallography, 5 (5) 347-352 doi:10.1107/s0021889872009744
Louër, D., Weigel, D., Langford, J. I. (1972) Etude des profils de raies de diffraction des rayons X d'une poudre d'hydroxyde de nickel. Journal of Applied Crystallography, 5 (5) 353-359 doi:10.1107/s0021889872009756
Crane, G. R. (1972) The relation of physical properties to the symmetry of potassium iodate. Journal of Applied Crystallography, 5 (5) 360-365 doi:10.1107/s0021889872009768
McGehee, R., Renault, J. (1972) The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method. Journal of Applied Crystallography, 5 (5) 365-370 doi:10.1107/s002188987200977x
Davydov, G. V. (1972) K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya. Journal of Applied Crystallography, 5 (5) 370-371 doi:10.1107/s0021889872009781
Parker, B. A. (1972) On the enhanced small-angle X-ray scattering from polished surfaces of aluminum. Journal of Applied Crystallography, 5 (5) 372-373 doi:10.1107/s0021889872009793
Thomas, P. (1972) Production of sensitive converter screens for thermal neutron diffraction patterns. Journal of Applied Crystallography, 5 (5) 373-374 doi:10.1107/s002188987200980x
Faloci, C., Susanna, A., Zampini, F. (1972) Radiation hazards from X-ray diffraction equipment. Journal of Applied Crystallography, 5 (5) 375-376 doi:10.1107/s0021889872009811
McCarthy, G. J., Botdorf, R., Johnson, G. G. (1972) Crystal data for samarium, holmium and lutetium iron garnets. Journal of Applied Crystallography, 5 (5) 377-378 doi:10.1107/s0021889872009823
Howlett, D. R. (1972) Crystal data for potassium sodium silicofluoride, K2SiF6.Na2SiF6. Journal of Applied Crystallography, 5 (5) 378-379 doi:10.1107/s0021889872009835
Agrawal, S. P., Agrawal, B. D. (1972) Crystal data on mercury picramate, Hg[C6H2(NO2)2(NH2)O]2.H2O. Journal of Applied Crystallography, 5 (5) 379-380 doi:10.1107/s0021889872009847
Lundy, D. R., Eanes, E. D. (1972) A computer program for the separation of linearly sloping backgrounds in X-ray line broadening analysis. Journal of Applied Crystallography, 5 (5) 380-381 doi:10.1107/s0021889872009859
Barns, R. L. (1972) A method of preparation of powder samples for Debye–Scherrer–Hull X-ray diffraction. Journal of Applied Crystallography, 5 (5) 381-382 doi:10.1107/s0021889872009860
Kennard, C. H. L. (1972) Practical experiments in crystallography. Structure solution using `Patterson' heavy-atom technique. Journal of Applied Crystallography, 5 (5) 382 doi:10.1107/s0021889872009872
Kennard, C. H. L. (1972) Practical experiments in crystallography: simulation of structure-factor and one-dimensional electron-density calculations. Journal of Applied Crystallography, 5 (5) 382 doi:10.1107/s0021889872009884
(1972) Commission on Neutron Diffraction. Journal of Applied Crystallography, 5 (5) 383 doi:10.1107/s0021889872009896
(1972) Notes and News. Journal of Applied Crystallography, 5 (5) 383 doi:10.1107/s0021889872009902
(1972) Crystallographers. Journal of Applied Crystallography, 5 (5) 383-384 doi:10.1107/s0021889872009914
Pearson, W. B. (1972) Landolt–Börnstein. Numerical data and functional relationships in science and technology. Group III. Vol. 6. Structure data of elements and intermetallic phasesedited by K.-H. Hellwege. Journal of Applied Crystallography, 5 (5) 384 doi:10.1107/s0021889872009926
Schulze, G. E. R. (1972) The Physics of Metals and Metallographyedited by S. V. Vonsovsky. Journal of Applied Crystallography, 5 (5) 384-385 doi:10.1107/s0021889872009938
Schloemer, H. (1972) Hydrothermal synthesis of crystalsedited by A. N. Lobachev. Journal of Applied Crystallography, 5 (5) 385 doi:10.1107/s002188987200994x
Pauly, H. (1972) Tables for microscopic identification of ore materialsby W. Uytenbogaardt and E. A. J. Burke. Journal of Applied Crystallography, 5 (5) 385-386 doi:10.1107/s0021889872009951
Geake, J. E. (1972) Polarization interferometers: applications in microscopy and macroscopyby M. Françon and S. Mallick. Journal of Applied Crystallography, 5 (5) 387 doi:10.1107/s0021889872009963
Cauchois, Y. (1972) Principles and Practice of X-ray Spectrometric Analysisby E. P. Bertin. Journal of Applied Crystallography, 5 (5) 387-388 doi:10.1107/s0021889872009975
Woolfson, M. M. (1972) Optical microscopy for the materials sciencesby J. H. Richardson. Journal of Applied Crystallography, 5 (5) 388 doi:10.1107/s0021889872009987
Woolfson, M. M. (1972) Handbook of electronic materials. Vol. 6. Silicon nitride for microelectronic applications, Part 2by J. T. Milek. Journal of Applied Crystallography, 5 (5) 388 doi:10.1107/s0021889872009999

See Also

These are possibly similar items as determined by title/reference text matching only.

(1996, October) Journal of Applied Crystallography Vol. 29 (5) International Union of Crystallography (IUCr)
(1997, October) Journal of Applied Crystallography Vol. 30 (5) International Union of Crystallography (IUCr)
(1998, October) Journal of Applied Crystallography Vol. 31 (5) International Union of Crystallography (IUCr)
(1999, October) Journal of Applied Crystallography Vol. 32 (5) International Union of Crystallography (IUCr)
(2000, October) Journal of Applied Crystallography Vol. 33 (5) International Union of Crystallography (IUCr)
(2001, October) Journal of Applied Crystallography Vol. 34 (5) International Union of Crystallography (IUCr)
(2002, October) Journal of Applied Crystallography Vol. 35 (5) International Union of Crystallography (IUCr)
(2003, October) Journal of Applied Crystallography Vol. 36 (5) International Union of Crystallography (IUCr)
(2004, October) Journal of Applied Crystallography Vol. 37 (5) International Union of Crystallography (IUCr)
(2005, October) Journal of Applied Crystallography Vol. 38 (5) International Union of Crystallography (IUCr)
(2006, October) Journal of Applied Crystallography Vol. 39 (5) International Union of Crystallography (IUCr)
 
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