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Davydov, G. V. (1972) K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya. Journal of Applied Crystallography, 5 (5) 370-371 doi:10.1107/s0021889872009781

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Reference TypeJournal (article/letter/editorial)
TitleK vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya
JournalJournal of Applied Crystallography
AuthorsDavydov, G. V.Author
Year1972 (October 1)Volume5
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889872009781Search in ResearchGate
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Mindat Ref. ID463591Long-form Identifiermindat:1:5:463591:2
GUID0
Full ReferenceDavydov, G. V. (1972) K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya. Journal of Applied Crystallography, 5 (5) 370-371 doi:10.1107/s0021889872009781
Plain TextDavydov, G. V. (1972) K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya. Journal of Applied Crystallography, 5 (5) 370-371 doi:10.1107/s0021889872009781
In(1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr)

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Davydov, G. V., Bartenev, G. M. (1972) K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnost po uglam rasseyaniya, obuslovlennoy faktorami dispernosti i formi oblastey kogerentnogo rasseyaniya. Journal of Applied Crystallography, 5 (2) 90-92 doi:10.1107/s0021889872008842
Davydov, G. V., Erokhov, N. A., Erofeev, V. M. (1972) K voprosu o kharakternikh tochkakh profilya dubletnikhKα liniu pri rentgenostrukturom analyze polykristallov. Journal of Applied Crystallography, 5 (2) 92-95 doi:10.1107/s0021889872008854
Barabash, I. A., Davydov, G. V., Veselov, A. A. (1969) Interpretatsiya poroshkovikh rentgenogramm polykristallov s primeneniem elektronno-vichislitelnikh mashin (EVM) I. Programma dlya srednik kristallicheskikh sistem. Journal of Applied Crystallography, 2 (1) 10-14 doi:10.1107/s0021889869006406
Barabash, I. A., Davydov, G. V., Veselov, A. A. (1969) Interpretatsiya poroshkovikh rentgenogramm polykristallov s primeneniem elektronno-vichislitelnikh mashin (EVM) II. Programma dlya nizshikh singoniy. Journal of Applied Crystallography, 2 (1) 14-17 doi:10.1107/s0021889869006418
Tomassini, M. (1985) TYPIST – a program for the tabulation of crystallographic results. Journal of Applied Crystallography, 18 (5) 370-371 doi:10.1107/s0021889885010536
(1976) Crystallographers. Journal of Applied Crystallography, 9 (4) 370-371 doi:10.1107/s002188987601159x
Schulze, G. E. R. (1972) The Physics of Metals and Metallographyedited by S. V. Vonsovsky. Journal of Applied Crystallography, 5 (5) 384-385 doi:10.1107/s0021889872009938
Garlick, G. F. J. (1972) Electroluminescence, Vol 50edited by D. V. Skobel'tsyn. Journal of Applied Crystallography, 5 (6) 442 doi:10.1107/s0021889872010209
(1972) Crystallographers. Journal of Applied Crystallography, 5 (5) 383-384 doi:10.1107/s0021889872009914
(1972) Notes and News. Journal of Applied Crystallography, 5 (5) 383 doi:10.1107/s0021889872009902
Dachs, H., Knorr, K. (1972) Guinier camera for single crystal investigation. Journal of Applied Crystallography, 5 (5) 338-342 doi:10.1107/s0021889872009720
 
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