Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryMineral Visual ExplorerAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral QuizTime Machine
Photo SearchPhoto GalleriesSearch by ColorPhoto Colour ExplorerNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Markiewicz, Peter, Goh, M. Cynthia (1995) Atomic force microscope tip deconvolution using calibration arrays. Review of Scientific Instruments, 66 (5). 3186-3190 doi:10.1063/1.1145549

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAtomic force microscope tip deconvolution using calibration arrays
JournalReview of Scientific Instruments
AuthorsMarkiewicz, PeterAuthor
Goh, M. CynthiaAuthor
Year1995 (May)Volume66
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1145549Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4871997Long-form Identifiermindat:1:5:4871997:3
GUID0
Full ReferenceMarkiewicz, Peter, Goh, M. Cynthia (1995) Atomic force microscope tip deconvolution using calibration arrays. Review of Scientific Instruments, 66 (5). 3186-3190 doi:10.1063/1.1145549
Plain TextMarkiewicz, Peter, Goh, M. Cynthia (1995) Atomic force microscope tip deconvolution using calibration arrays. Review of Scientific Instruments, 66 (5). 3186-3190 doi:10.1063/1.1145549
In(1995, May) Review of Scientific Instruments Vol. 66 (5) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Markiewicz, Peter, Goh, M. Cynthia (1994) Atomic force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure. Langmuir, 10. 5-7 doi:10.1021/la00013a002
Reitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653
Eisenstein, Alon, Goh, M. Cynthia (2012) Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips. Review of Scientific Instruments, 83 (3). 36108pp. doi:10.1063/1.3698073
Jensen, F. (1993) z calibration of the atomic force microscope by means of a pyramidal tip. Review of Scientific Instruments, 64 (9). 2595-2597 doi:10.1063/1.1143873
Anderson, Mark S. (2019) Nanofluidic chromatography using a vibrating atomic force microscope tip. Review of Scientific Instruments, 90 (9). 93701pp. doi:10.1063/1.5097592
Sader, John E., Larson, Ian, Mulvaney, Paul, White, Lee R. (1995) Method for the calibration of atomic force microscope cantilevers. Review of Scientific Instruments, 66 (7). 3789-3798 doi:10.1063/1.1145439
Kikuta, Hisao, Nasu, Kosuke, Kato, Nobuhiro, Iwata, Koichi (1995) Atomic force microscope using optical heterodyne detection incorporated in an optical microscope. Review of Scientific Instruments, 66 (1). 87-90 doi:10.1063/1.1146192
Lefever, Joel A.; Labuda, Aleksander; Proksch, Roger (2026) Lateral force microscopy calibration using an interferometric atomic force microscope. Review of Scientific Instruments, 97 (4). doi:10.1063/5.0318278
Sader, John E., Friend, James R. (2015) Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers. Review of Scientific Instruments, 86 (5). 56106pp. doi:10.1063/1.4921192
Aksu, Saltuk B., Turner, Joseph A. (2007) Calibration of atomic force microscope cantilevers using piezolevers. Review of Scientific Instruments, 78 (4). 43704pp. doi:10.1063/1.2719649
Khare, H. S., Burris, D. L. (2013) The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes. Review of Scientific Instruments, 84 (5). 55108pp. doi:10.1063/1.4804163
 
and/or  
Mindat.org® is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization. Mindat® and mindat.org® are registered trademarks of the Hudson Institute of Mineralogy.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2026, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph and Ida Chau.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: June 4, 2026 20:11:53
Go to top of page