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Aksu, Saltuk B., Turner, Joseph A. (2007) Calibration of atomic force microscope cantilevers using piezolevers. Review of Scientific Instruments, 78 (4). 43704pp. doi:10.1063/1.2719649

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Reference TypeJournal (article/letter/editorial)
TitleCalibration of atomic force microscope cantilevers using piezolevers
JournalReview of Scientific Instruments
AuthorsAksu, Saltuk B.Author
Turner, Joseph A.Author
Year2007Volume78
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.2719649Search in ResearchGate
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Mindat Ref. ID4897697Long-form Identifiermindat:1:5:4897697:6
GUID0
Full ReferenceAksu, Saltuk B., Turner, Joseph A. (2007) Calibration of atomic force microscope cantilevers using piezolevers. Review of Scientific Instruments, 78 (4). 43704pp. doi:10.1063/1.2719649
Plain TextAksu, Saltuk B., Turner, Joseph A. (2007) Calibration of atomic force microscope cantilevers using piezolevers. Review of Scientific Instruments, 78 (4). 43704pp. doi:10.1063/1.2719649
In(2007) Review of Scientific Instruments Vol. 78 (4) AIP Publishing

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Reitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653
Sader, John E., Friend, James R. (2015) Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers. Review of Scientific Instruments, 86 (5). 56106pp. doi:10.1063/1.4921192
Gates, Richard S., Reitsma, Mark G. (2007) Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array. Review of Scientific Instruments, 78 (8). 86101pp. doi:10.1063/1.2764372
Scholl, D., Everson, M. P., Jaklevic, R. C. (1994) In situ force calibration of high force constant atomic force microscope cantilevers. Review of Scientific Instruments, 65 (7). 2255-2257 doi:10.1063/1.1144737
Sader, John E., Friend, James R. (2014) Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor. Review of Scientific Instruments, 85 (11). 116101pp. doi:10.1063/1.4901227
Kim, Youngkyu, Mandriota, Nicola, Goodnight, Davis, Sahin, Ozgur (2020) Calibration of T-shaped atomic force microscope cantilevers using the thermal noise method. Review of Scientific Instruments, 91 (8) 83703pp. doi:10.1063/5.0013091
Sader, John E., Chon, James W. M., Mulvaney, Paul (1999) Calibration of rectangular atomic force microscope cantilevers. Review of Scientific Instruments, 70 (10). 3967-3969 doi:10.1063/1.1150021
Thomson, R. E. (1999) Low-temperature atomic force microscope using piezoresistive cantilevers. Review of Scientific Instruments, 70 (8). 3369-3372 doi:10.1063/1.1149945
Lefever, Joel A.; Labuda, Aleksander; Proksch, Roger (2026) Lateral force microscopy calibration using an interferometric atomic force microscope. Review of Scientific Instruments, 97 (4). doi:10.1063/5.0318278
Muševič, I., Kočevar, K., Kržič, U., Carbone, G. (2005) Force spectroscopy based on temperature controlled atomic force microscope head using piezoresistive cantilevers. Review of Scientific Instruments, 76 (4). 43701pp. doi:10.1063/1.1884191
Sader, John Elie (2003) Susceptibility of atomic force microscope cantilevers to lateral forces. Review of Scientific Instruments, 74 (4). 2438-2443 doi:10.1063/1.1544421
 
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