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Boyer, Michael A. (2018) Scanning Electron Microscopy in High School Engineering Research. Microscopy and Microanalysis, 24. 2348-2349 doi:10.1017/s1431927618012229

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Reference TypeJournal (article/letter/editorial)
TitleScanning Electron Microscopy in High School Engineering Research
JournalMicroscopy and Microanalysis
AuthorsBoyer, Michael A.Author
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618012229Search in ResearchGate
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Mindat Ref. ID4884744Long-form Identifiermindat:1:5:4884744:3
GUID0
Full ReferenceBoyer, Michael A. (2018) Scanning Electron Microscopy in High School Engineering Research. Microscopy and Microanalysis, 24. 2348-2349 doi:10.1017/s1431927618012229
Plain TextBoyer, Michael A. (2018) Scanning Electron Microscopy in High School Engineering Research. Microscopy and Microanalysis, 24. 2348-2349 doi:10.1017/s1431927618012229
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

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