Chen, S., Ducic, T., Jin, Q., Wu, X., Zaluzec, N., Lai, B. (2018) Synchrotron-based X-ray Fluorescence Microscopy as a Complementary Tool to Light Microscopy/Electron Microscopy for Multi-scale and Multi-modality Analysis. Microscopy and Microanalysis, 24. 88-89 doi:10.1017/s1431927618012825
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Synchrotron-based X-ray Fluorescence Microscopy as a Complementary Tool to Light Microscopy/Electron Microscopy for Multi-scale and Multi-modality Analysis | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Chen, S. | Author | |
| Ducic, T. | Author | ||
| Jin, Q. | Author | ||
| Wu, X. | Author | ||
| Zaluzec, N. | Author | ||
| Lai, B. | Author | ||
| Year | 2018 (August) | Volume | 24 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927618012825Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4884841 | Long-form Identifier | mindat:1:5:4884841:5 |
| GUID | 0 | ||
| Full Reference | Chen, S., Ducic, T., Jin, Q., Wu, X., Zaluzec, N., Lai, B. (2018) Synchrotron-based X-ray Fluorescence Microscopy as a Complementary Tool to Light Microscopy/Electron Microscopy for Multi-scale and Multi-modality Analysis. Microscopy and Microanalysis, 24. 88-89 doi:10.1017/s1431927618012825 | ||
| Plain Text | Chen, S., Ducic, T., Jin, Q., Wu, X., Zaluzec, N., Lai, B. (2018) Synchrotron-based X-ray Fluorescence Microscopy as a Complementary Tool to Light Microscopy/Electron Microscopy for Multi-scale and Multi-modality Analysis. Microscopy and Microanalysis, 24. 88-89 doi:10.1017/s1431927618012825 | ||
| In | (2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP) | ||
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