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Dahmen, Tim, Trampert, Patrick (2019) An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation. Microscopy and Microanalysis, 25. 154-155 doi:10.1017/s1431927619001508

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Reference TypeJournal (article/letter/editorial)
TitleAn Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation
JournalMicroscopy and Microanalysis
AuthorsDahmen, TimAuthor
Trampert, PatrickAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619001508Search in ResearchGate
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Mindat Ref. ID4885783Long-form Identifiermindat:1:5:4885783:9
GUID0
Full ReferenceDahmen, Tim, Trampert, Patrick (2019) An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation. Microscopy and Microanalysis, 25. 154-155 doi:10.1017/s1431927619001508
Plain TextDahmen, Tim, Trampert, Patrick (2019) An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation. Microscopy and Microanalysis, 25. 154-155 doi:10.1017/s1431927619001508
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Dahmen, Tim, Trampert, Patrick (2019) Sparse and Adaptive Sampling in Scanning Electron Microscopy. Microscopy and Microanalysis, 25. 29-30 doi:10.1017/s1431927619000035
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2019) Deep Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 25. 158-159 doi:10.1017/s1431927619001521
Dahmen, Tim, Potocek, Pavel, Trampert, Patrick, Peemen, Maurice, Schoenmakers, Remco (2019) Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures. Microscopy and Microanalysis, 25. 196-197 doi:10.1017/s1431927619001715
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2018) Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 24. 700-701 doi:10.1017/s1431927618003999
Dahmen, Tim, de Jonge, Niels, Trampert, Patrick, Engstler, Michael, Pauly, Christoph, Mücklich, Frank, Slusallek, Philipp (2016) “Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy. Microscopy and Microanalysis, 22. 632-633 doi:10.1017/s1431927616004013
Potocek, Pavel, Trampert, Patrick, Peemen, Maurice, Schoenmakers, Remco, Dahmen, Tim (2020) Sparse Scanning Electron Microscopy Data Acquisition and Deep Neural Networks for Automated Segmentation in Connectomics. Microscopy and Microanalysis, 26 (3) 403-412 doi:10.1017/s1431927620001361
Dahmen, Tim, Engstler, Michael, Pauly, Christoph, Trampert, Patrick, de Jonge, Niels, MĂĽcklich, Frank, Slusallek, Philipp (2016) Feature Adaptive Sampling for Scanning Electron Microscopy. Scientific Reports, 6. doi:10.1038/srep25350
Trampert, Patrick, Dahmen, Tim, Slusallek, Philipp (2019) Application of Missing Wedge Inpainting in Material Science. Microscopy and Microanalysis, 25. 440-441 doi:10.1017/s1431927619002939
Dahmen, Tim, Trampert, Patrick, Slusallek, Philipp (2018) Blob-based Algebraic Reconstruction Technique for Computed Laminography. Microscopy and Microanalysis, 24. 994-995 doi:10.1017/s1431927618005469
Boughorbel, Faysal, Potocek, Pavel, Hovorka, Milos, Strakos, Libor, Mitchels, John, Vystavel, Tomas, Trampert, Patrick, Ben Lich, , Dahmen, Tim (2017) High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing. Microscopy and Microanalysis, 23. 150-151 doi:10.1017/s143192761700143x
Trampert, Patrick, Bogachev, Sviatoslav, Marniok, Nico, Dahmen, Tim, Slusallek, Philipp (2015) Marker Detection in Electron Tomography: A Comparative Study. Microscopy and Microanalysis, 21 (6). 1591-1601 doi:10.1017/s1431927615015433
 
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