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Reed, S. J. B. (1972) Electron microprobe analysis at low operating voltage: Discussion. American Mineralogist, 57 (9-10) 1550-1551

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Reference TypeJournal (article/letter/editorial)
TitleElectron microprobe analysis at low operating voltage: Discussion
JournalAmerican Mineralogist
AuthorsReed, S. J. B.Author
Year1972Volume57
Issue9-10
PublisherMineralogical Society of America
Download URLhttp://www.minsocam.org/ammin/AM57/AM57_1550.pdf+
Mindat Ref. ID525937Long-form Identifiermindat:1:5:525937:7
GUID0
Full ReferenceReed, S. J. B. (1972) Electron microprobe analysis at low operating voltage: Discussion. American Mineralogist, 57 (9-10) 1550-1551
Plain TextReed, S. J. B. (1972) Electron microprobe analysis at low operating voltage: Discussion. American Mineralogist, 57 (9-10) 1550-1551
In(1972) American Mineralogist Vol. 57 (9-10) Mineralogical Society of America

See Also

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Desborough, George A., Heidel, Robert H. (1971) Improved electron microprobe analysis at low operating voltage I. Silicon, magnesium and aluminum. American Mineralogist, 56 (11-12) 2129-2135
Desborough, George A., Heidel, Robert H., Czamanske, and Gerald K. (1971) Improved quantitative electron microprobe analysis at low operating voltage: II. Sulfur. American Mineralogist, 56 (11-12) 2136-2141
Anthony, John W., McLean, W. John, Laughon, and Robert B. (1972) The crystal structure of yavapaiite: A discussion. American Mineralogist, 57 (9-10) 1546-1549
Fittipaldo, M. (2006) ELECTRON MICROPROBE ANALYSIS AND SCANNING ELECTRON MICROSCOPY IN GEOLOGY (2nd ed.): by S.J.B. Reed, Cambridge University Press, August 2005. 206 pages, $70.00. American Mineralogist, 91 (10) 1714 doi:10.2138/am.2006.475
Springer, G. (1974) The role of carbon film thickness in electron microprobe analysis: A comment . American Mineralogist, 59 (9-10) 1121-1122
Kerrick, Derrill M., Eminhizer, Leland B., Villaume, and James F. (1973) The role of carbon film thickness in electron microprobe analysis. American Mineralogist, 58 (9-10) 920-925
Steele, Ian M. (1976) Electron Microprobe Analysis. S. J. B. Reed. The Journal of Geology, 84 (5) 627 doi:10.1086/628240
Pande, Chandra S. (1976) Electron Microprobe Analysis by S. J. B. Reed. Reviewer. Review of Scientific Instruments, 47 (2). 260 doi:10.1063/1.1134604
Heinrich, K. F. J. (1976) Electron microprobe analysisby S. J. B. Reed. Journal of Applied Crystallography, 9 (1) 59-60 doi:10.1107/s0021889876010601
(1972) Book Reviews. American Mineralogist, 57 (9-10) 1562-1568
Smith, D. G. W., Reed, S. J. B. (1981) The calculation of background in wavelength-dispersive electron microprobe analysis. X-Ray Spectrometry, 10 (4). 198-202 doi:10.1002/xrs.1300100412
 
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