| Reference Type | Journal (article/letter/editorial) |
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| Title | The role of carbon film thickness in electron microprobe analysis |
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| Journal | American Mineralogist |
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| Authors | Kerrick, Derrill M. | Author |
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| Eminhizer, Leland B. | Author |
| Villaume, and James F. | Author |
| Year | 1973 | Volume | 58 |
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| Issue | 9-10 |
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| Publisher | Mineralogical Society of America |
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| Download URL | http://www.minsocam.org/ammin/AM58/AM58_920.pdf+ |
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| Mindat Ref. ID | 526141 | Long-form Identifier | mindat:1:5:526141:7 |
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| GUID | 0 |
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| Full Reference | Kerrick, Derrill M., Eminhizer, Leland B., Villaume, and James F. (1973) The role of carbon film thickness in electron microprobe analysis. American Mineralogist, 58 (9-10) 920-925 |
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| Plain Text | Kerrick, Derrill M., Eminhizer, Leland B., Villaume, and James F. (1973) The role of carbon film thickness in electron microprobe analysis. American Mineralogist, 58 (9-10) 920-925 |
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| In | (1973) American Mineralogist Vol. 58 (9-10) Mineralogical Society of America |
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These are possibly similar items as determined by title/reference text matching only.