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Rachlin, Alan L., Henderson, Grant S., Goh, M. Cynthia (1992) An atomic force microscope (AFM) study of the calcite cleavage plane: Image averaging in Fourier space. American Mineralogist, 77 (9-10) 904-910

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Reference TypeJournal (article/letter/editorial)
TitleAn atomic force microscope (AFM) study of the calcite cleavage plane: Image averaging in Fourier space
JournalAmerican Mineralogist
AuthorsRachlin, Alan L.Author
Henderson, Grant S.Author
Goh, M. CynthiaAuthor
Year1992Volume77
Issue9-10
PublisherMineralogical Society of America
Download URLhttp://www.minsocam.org/ammin/AM77/AM77_904.pdf+
Mindat Ref. ID529348Long-form Identifiermindat:1:5:529348:7
GUID0
Full ReferenceRachlin, Alan L., Henderson, Grant S., Goh, M. Cynthia (1992) An atomic force microscope (AFM) study of the calcite cleavage plane: Image averaging in Fourier space. American Mineralogist, 77 (9-10) 904-910
Plain TextRachlin, Alan L., Henderson, Grant S., Goh, M. Cynthia (1992) An atomic force microscope (AFM) study of the calcite cleavage plane: Image averaging in Fourier space. American Mineralogist, 77 (9-10) 904-910
In(1992) American Mineralogist Vol. 77 (9-10) Mineralogical Society of America

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Vrdoljak, Gordon A., Henderson, Grant S., Fawcett, J. Jeffrey, Wicks, Frederick J. (1994) Structural relaxation of the chlorite surface imaged by the atomic force microscope. American Mineralogist, 79 (1-2) 107-112
Baba, Miyuki, Kakitani, Satoru, Ishii, Hiroshi, Okuno, Tadashi (1997) Fine atomic image of mica cleavage planes obtained with an atomic force microscope (AFM) and a novel procedure for image processing. Chemical Physics, 221. 23-31 doi:10.1016/s0301-0104(97)00141-9
Henderson, Grant S., Vrdoljak, Gordon A., Eby, Ray K., Wicks, Frederick J., Rachlin, Alan L. (1994) Atomic force microscopy studies of layer silicate minerals. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 87. 197-212 doi:10.1016/0927-7757(94)80068-5
Markiewicz, Peter, Goh, M. Cynthia (1995) Atomic force microscope tip deconvolution using calibration arrays. Review of Scientific Instruments, 66 (5). 3186-3190 doi:10.1063/1.1145549
Ross, Clarence S. (1950) The dark-field stereoscopic microscope for mineralogic studies. American Mineralogist, 35 (9-10) 906-910
Eisenstein, Alon, Goh, M. Cynthia (2012) Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips. Review of Scientific Instruments, 83 (3). 36108pp. doi:10.1063/1.3698073
Giessibl, F.J., Binnig, G. (1992) Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy, 42. 281-289 doi:10.1016/0304-3991(92)90280-w
Wang, Yongcai, Juhue, Didier, Winnik, Mitchell A., Leung, On Man, Goh, M. Cynthia (1992) Atomic force microscopy study of latex film formation. Langmuir, 8. 760-762 doi:10.1021/la00039a004
Hochella, Michael F., Jr.,, Eggleston, Carrick M., Elings, Virgil B., Thompson, Matthew S. (1990) Atomic structure and morphology of the albite {010} surface: An atomic-force microscope and electron diffraction study. American Mineralogist, 75 (7-8) 723-730
Kikuchi, M., Syono, Y., Velde, B. (1993) Shock wave effects on kaolinite and other clays. American Mineralogist, 78 (9-10) 904-910
Henderson, C. M. B., Thompson, Alan Bruce (1980) The low-temperature inversion in sub-potassic nephelines . American Mineralogist, 65 (9-10) 970-980
 
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