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Gillen, Greg, Bright, David (2006) Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry. Scanning, 25 (4). 165-174 doi:10.1002/sca.4950250402

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Reference TypeJournal (article/letter/editorial)
TitleTools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
JournalScanning
AuthorsGillen, GregAuthor
Bright, DavidAuthor
Year2006 (December 6)Volume25
Issue4
PublisherWiley
DOIdoi:10.1002/sca.4950250402Search in ResearchGate
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Mindat Ref. ID6445835Long-form Identifiermindat:1:5:6445835:5
GUID0
Full ReferenceGillen, Greg, Bright, David (2006) Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry. Scanning, 25 (4). 165-174 doi:10.1002/sca.4950250402
Plain TextGillen, Greg, Bright, David (2006) Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry. Scanning, 25 (4). 165-174 doi:10.1002/sca.4950250402
In(2006, December) Scanning Vol. 25 (4) Wiley

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Gillen, Greg, Wight, Scott, Bright, David, Herne, Tonya (2006) Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope. Scanning, 20 (5). 404-409 doi:10.1002/sca.1998.4950200506
Gillen, Greg, Roberson, Sonya, Ng, Connie, Stranick, Michael (2006) Elemental and molecular imaging of human hair using secondary ion mass spectrometry. Scanning, 21 (3). 173-181 doi:10.1002/sca.4950210301
Wight, Scott, Gillen, Greg, Herne, Tonya (2006) Development of environmental scanning electron microscopy electron beam profile imaging with self-assembled monolayers and secondary ion mass spectroscopy. Scanning, 19 (2). 71-74 doi:10.1002/sca.4950190202
Newbury, Dale E. (1980) Methods for quantitative analysis in secondary ion mass spectrometry. Scanning, 3 (2). 110-118 doi:10.1002/sca.4950030206
Gillen, Greg., Simons, David S., Williams, Peter. (1990) Molecular ion imaging and dynamic secondary-ion mass spectrometry of organic compounds. Analytical Chemistry, 62 (19). 2122-2130 doi:10.1021/ac00218a014
Brewer, Tim M., Szakal, Christopher, Gillen, Greg (2010) Method for improved secondary ion yields in cluster secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry, 24 (5). 593-598 doi:10.1002/rcm.4423
Zinner, E. (1980) Depth profiling by secondary ion mass spectrometry. Scanning, 3 (2). 57-78 doi:10.1002/sca.4950030202
Gillen, Greg, Mahoney, Christine, Wight, Scott, Lareau, Richard (2006) Characterization of high explosive particles using cluster secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry, 20 (12). 1949-1953 doi:10.1002/rcm.2531
Ishitani, Tohru, Ohya, Kaoru (2006) Comparison in spatial spreads of secondary electron information between scanning ion and scanning electron microscopy. Scanning, 25 (4). 201-209 doi:10.1002/sca.4950250407
Newbury, Dale E., Bright, David S. (2006) “Derived spectra” software tools for detecting spatial and spectral features in spectrum images. Scanning, 27 (1). 15-22 doi:10.1002/sca.4950270104
Gillen, Greg, Roberson, Sonya (1998) Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry, 12 (19). 1303-1312 doi:10.1002/(sici)1097-0231(19981015)12:19<1303::aid-rcm330>3.0.co;2-7
 
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